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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices 14.0%OFF

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

by Takashi Nakamura, Eishi Yahagi and Hideaki Kameyama

  • ISBN

    :  

    9789812778819

  • Publisher

    :  

    World Scientific Publishing Company

  • Subject

    :  

    Computer Hardware, Technology: General Issues, Physics

  • Binding

    :  

    HARDCOVER

  • Pages

    :  

    368

  • Year

    :  

    2008

₹

19022.0

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₹

16358.0

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  • Description

    Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features. Contents: Terrestrial Neutron Spectrometry and Dosimetry; Irradiation Testing in the Terrestrial Field; Neutron Irradiation Test Facilities; Review and Discussion of Experimental Data; Monte Carlo Simulation Methods; Simulation Results and Their Implications; International Standardization of the Neutron Test Method; Summary and Challenges.

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